Crystallographic Structure and Band Calculation of Pentacene Polymorphs
نویسندگان
چکیده
منابع مشابه
Raman Identification of Polymorphs in Pentacene Films
We use Raman spectroscopy to characterize thin films of pentacene grown on Si/SiOx by Supersonic Molecular Beam Deposition (SuMBD). We find that films up to a thickness of about 781 Å (∼ 52 monolayers) all belong to the so-called thin-film (TF) phase. The appearance with strong intensity of some lattice phonons suggests that the films are characterized by good intra-layer order. A comparison of...
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ژورنال
عنوان ژورنال: Journal of the Vacuum Society of Japan
سال: 2013
ISSN: 1882-2398,1882-4749
DOI: 10.3131/jvsj2.56.24